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| Application of Infrared Spectroscopy Method in Diagnosis on Potential Fault of Damaged Silicon Insulator in SF6 Electrical Equipment |
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| DOI： |
| KeyWord:high voltage insulation equipment Fourier infrared spectroscopic analysis SF6 decomposition product SiF4 detectionSF6 |
| Author | Institution |
| YANG Ren*,WANG Jin-xing,LEI Yong-qian,GAO Chao，ZHANG Wan-jun，YANG Ding-ge |
1.国网陕西省电力公司电力科学研究院;2.中国广州分析测试中心 |
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| Abstract: |
| SiF4 was qualitatively and quantitatively analyzed by Fourier transferred infrared spectroscopy.The linear range for the method was 10-500 μL/L,and the detection limit was 1 μL/L.The method was applied in the potential fault diagnosis of SF6 gas insulated switch,and the effectiveness of the SiF4 in the diagnosis of the internal conditions in the equipment was verified. |
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